纳米制造 关键控制特性 第 6-17 部分：石墨烯基材料 阶参数：X 射线衍射和透射电子显微镜

[中文适用范围]： 本部分IEC TS 62607建立了一种标准化方法，通过X射线衍射（XRD）和透射电子显微镜（TEM）测定石墨烯基材料和层状碳材料的关键控制特性——有序参数。 有序参数从两个角度进行分析：z轴和x-y轴。在z轴中，有序参数源自XRD光谱中峰值（002）的半高宽（FWHM）。在x-y轴中，它源自通过SAED（选区电子衍射）技术获得的衍射图案对应的峰值（100）的FWHM，该技术在全球大多数透射电子显微镜上常规进行。 该方法适用于石墨烯基材料和层状碳材料，包括石墨、膨胀石墨、无定形碳、玻璃碳或玻璃状碳，其结构已通过其他表征技术明确。 该方法适用于区分少层石墨烯或还原氧化石墨烯与层状碳材料。 典型应用领域是制造中的质量控制，以确保批次间的重现性。 注：氧化石墨烯，一种石墨烯基材料，不在本文件的范围内。 [外文原描述]： IEC TS 62607-6-17:2023 establishes a standardized method to determine the key control characteristic order parameter for graphene-based material and layered carbon material by X-ray diffraction (XRD) and transmission electron microscopy. The order parameter is analysed from two perspectives: z-axis and x-y-axis. In the z-axis the order parameter is derived from the full width at half maximum (FWHM) of peak (002) in the XRD spectrum. In the x-y-axis, it is derived from the FWHM of peak (100) corresponding to diffraction patterns obtained by SAED (selected area electron diffraction) technique, which is routinely performed on most transmission electron microscopes in the world. The method is applicable for graphene-based material and layered carbon material including graphite, expanded graphite, amorphous carbon, vitreous carbon or glassy carbon, the structures of which are clarified by other characterization techniques. The method is applicable for differentiating few-layer graphene or reduced graphene oxide from layered carbon material. Typical application area is quality control in manufacturing to ensure batch-to-batch reproducibility. NOTE Graphene oxide, one type of graphene-based material, is not within the scope of this document.