标准摘要
[中文适用范围]： 本部分IEC TS 62607建立了一种标准化方法，通过结合原子力显微镜、光学透射和拉曼光谱，确定石墨烯薄片的关键控制特性——层数。 [外文原描述]： IEC TS 62607-6-2:2023 establishes a standardized method to determine the key control characteristic - number of layers for graphene flakes by a combination of - atomic force microscopy, - optical transmission, and - Raman spectroscopy
英文名称Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy