标准摘要
[中文适用范围]： IEC TS 62607-6-24:2026 是一项技术规范，确立了通过光学对比度测量法测定化学气相沉积（CVD）石墨烯薄膜关键控制特性（KCC）——即层数分布的标准化方法。该方法依据 G 通道的对比度值，推导出 CVD 石墨烯薄膜的层数及其层数分布。本方法适用于位于 SiO₂/Si 衬底上、洁净且无扭曲多层结构的 CVD 石墨烯薄膜。 [外文原描述]： IEC TS 62607-6-24:2026 which is a Technical Specification, establishes a standardized method to determine the key control characteristic (KCC) • number of layer distribution for CVD graphene film by • optical contrast measurement The number of layers and number of layer distribution of CVD graphene film is derived by G‑channel contrast values. This method is applicable for clean CVD graphene film without twisted multilayer structures on a SiO2/Si substrate.
英文名称Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products - Number of layers of graphene: optical contrast