纳米制造 - 关键控制特性 - 第6-36部分：石墨烯相关产品 - 氧化石墨烯和还原氧化石墨烯的还原状态：紫外-可见吸收光谱法

[中文适用范围]： IEC TS 62607-6-36:2026（技术规范）确立了一种标准化方法，用于通过紫外 - 可见分光光度法（UV-Vis）确定氧化石墨烯（GO）和还原氧化石墨烯（rGO）的关键控制特性——还原程度。该还原程度并非定量数值，而是由从UV-Vis吸收光谱中提取的六个参数构成的表列。这六个参数可从GO和rGO中获取，具体如下：(1) GO的峰位；(2) GO的肩峰；(3) GO主吸收峰的半峰宽（FWHM）；(4) rGO的峰位；(5) rGO主吸收峰的半峰宽；(6) GO与rGO之间的光谱峰位移。该方法适用于不同还原技术制备的GO和rGO材料（其中rGO由相应的GO制得）的表征，亦适用于溶液或薄膜形式的商业产品。若对单个GO或rGO材料进行表征，则仅能获取部分参数：GO或rGO材料各自均可测量其峰位、半峰宽及肩峰，而峰位移需同时具备GO及其对应的rGO方可比较测定。该方法适用于质量保障及rGO生产过程中还原工艺的监控，但并未提供全面的化学分析；除UV-Vis光谱特征外，可能还需辅以其他检测技术。 [外文原描述]： IEC TS 62607-6-36:2026, which is a Technical Specification, establishes a standardized method to determine the key control characteristic • reduction status for graphene oxide (GO) and reduced graphene oxide (rGO) by • ultraviolet-visible spectroscopy (UV-Vis). The reduction status is not a quantitative value, but rather a compilation (table) of six parameters extracted from UV-Vis absorption spectra. These six parameters can be obtained from GO and rGO as follows: (1) the peak location of GO, (2) the shoulder peak of GO, (3) the full width at half maximum (FWHM) of the main absorption peak of GO, (4) the peak location of rGO, (5) FWHM of the main absorption peak of rGO and (6) the spectral peak shifts between GO and rGO. • The method is applicable to the characterization of GO and rGO materials (where rGO is obtained from the corresponding GO) produced by different reduction techniques, as well as to commercial products in solution or film form. • Individual GO or rGO materials can also be characterized, but only partial parameters can be obtained. Specifically, peak location, FWHM, and shoulder peak can be measured from each GO or rGO material, while peak shift requires both GO and its corresponding rGO for comparison. • The method is suitable for quality assurance and for monitoring the reduction process during the production of rGO. • The method does not provide full chemical analysis. Complementary techniques can be required beyond the UV-Vis spectral features.