标准摘要
[中文适用范围]： IEC 62607 的这一部分建立了一种确定二维 (2D) 单层或多层原子薄纳米碳石墨烯结构的表面电导的方法。这些是通过化学气相沉积 (CVD)、在碳化硅 (SiC) 上外延生长合成的，碳化硅 (SiC) 是从还原的氧化石墨烯 (rGO) 获得的或从石墨中机械剥离 [3]。测量是在充气的标准 R100 矩形波导配置中以其中一种谐振频率模式（通常为 7 GHz）进行的[4]。通过谐振腔进行表面电导测量涉及监测将样品插入谐振腔之前和之后的谐振频移和品质因数的变化，并与样品表面积进行定量相关。该测量并不明确取决于纳米碳层的厚度。不需要知道样本的厚度，但假设样本区域的横向尺寸是均匀的。 [外文原描述]： IEC TS 62607-6-4:2016(E) establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz. Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.
英文名称Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity