纳米制造 关键控制特性 第 8-3 部分：纳米金属氧化物界面器件 模拟电阻变化和电阻波动：电阻测量

[中文适用范围]： 本部分 IEC 62607 是一项技术规范，规定了通过电阻测量确定纳米金属氧化物界面器件的关键控制特性（模拟电阻变化和电阻波动）的测量协议。模拟电阻变化作为施加电压脉冲的函数在金属氧化物界面器件中进行测量。通过参数拟合评估电导变化与脉冲数关系的线性度。电阻波动的参数在拟合过程中同时计算。该方法适用于评估由金属氧化物界面器件组成的计算设备，例如记录学习过程作为模拟电阻变化的产品和电路。 [外文原描述]： IEC TS 62607-8-3:2023 This part of IEC 62607, which is a Technical Specification, specifies a measurement protocol to determine the key control characteristics - analogue resistance change, and - resistance fluctuation for nano-enabled metal-oxide interfacial devices by - electrical resistance measurement. Analogue resistance change as a function of applied voltage pulse is measured in metal-oxide interfacial devices. The linearity in the relationship of the variation of conductance and the pulse number is evaluated using the parameter fitting. The parameter of the resistance fluctuation is simultaneously computed in the fitting process. - This method is applicable for evaluating computing devices composed of the metal-oxide interfacial device, for example, product-sum circuits, which record the learning process as the analogue resistance change.