标准摘要
[中文适用范围]： 本部分 IEC 62607 规定了通过低频噪声光谱法测定金属-氧化物界面器件电子陷阱态激活能的测量协议。噪声谱峰温度在指定温度范围内获得，然后根据峰温度与频率的依赖关系计算激活能，以分析与电子陷阱态相关的能级。在假设电子陷阱处的捕获时间由阿伦尼乌斯函数描述的情况下，激活能由捕获时间的温度依赖性确定。 [外文原描述]： IEC 62607-8-4:2024 specifies a measurement protocol to determine the key control characteristic - activation energy of electronic trap states for metal-oxide interfacial devices by - low-frequency-noise spectroscopy The noise spectra peak temperatures are obtained within a designated temperature range. Activation energies are then calculated based on the frequency dependence of the peak temperatures to analyse the energy levels associated with the electronic trap states. The activation energy is determined by the temperature dependence of the capture time at electron traps under the assumption that it is described by an Arrhenius function. - In metal-oxide interfacial devices, electrical conductance is observed through an oxide nanolayer sandwiched between metal electrodes. - The size of the conductive path in metal-oxide interfacial devices is dependent on the current value and is usually nanoscale in diameter, taking the form of a filamentary wire. This evaluation method is useful for analysing the electronic trap states in nanowires and other miniaturized devices that have nanolayers.
英文名称Nanomanufacturing – Key control characteristics – Part 8-4: Metal-oxide interfacial devices – Activation energy of electronic trap states: Low-frequency-noise spectroscopy