国际电工委员会技术规范 第9-2部分：纳米磁性产品 磁场分布: 磁光指示薄膜技术

[中文适用范围]： 本部分 IEC 62607 建立了一种标准化方法，通过磁光指示膜技术确定纳米磁性材料、结构和器件的关键控制特性——磁场分布。 磁场分布是通过利用磁光指示膜来推导的，该膜是一种磁光材料的薄膜，放置在表现出空间变化磁场分布的物体表面。然后利用法拉第效应，通过分析通过磁光膜的光偏振面的旋转来测量磁场强度。 - 该方法适用于测量平面纳米磁性材料、结构和器件的杂散场分布。 - 该方法特别适用于对物体表面的杂散场分布进行快速定量测量。 - 磁光指示膜技术是一种快速、非破坏性的方法，使其成为工业材料分析和测试的有吸引力的选择。 - MOIF 测量无需任何样品制备，也不依赖于物体的特定表面特性。它可以应用于粗糙样品以及具有非磁性覆盖层的样品的表征。 - MOIF 可以定量测量磁场分布。 • 通过一次性测量，通常需要几秒钟 • 在几平方厘米的区域上（特殊技术可达直径15厘米） • 在1 mT至100 mT以上的磁场范围内 • 空间分辨率低至1微米 - 尽管具有纳米级分辨率的技术适用于分析磁场结构的细节，但它们表征较大区域的能力受到扫描区域的限制。因此，MOIF 技术是一种不可或缺的补充方法，可以提供对材料特性的更全面理解。 本文档重点介绍了校准程序、校准测量过程和测量不确定度的评估，以确保通过磁光指示膜技术获得的定量磁场测量的可追溯性。 [外文原描述]： IEC TS 62607-9-2:2024, which is a Technical Specification, establishes a standardized method to determine the key control characteristic • magnetic field distribution of nanomagnetic materials, structures and devices by the • magneto-optical indicator film technique. The magnetic field distribution is derived by utilizing a magneto optical indicator film, which is a thin film of magneto-optic material that is placed on the surface of an object exhibiting a spatially varying magnetic field distribution. The Faraday effect is then employed to measure the magnetic field strength by analysing the rotation of the polarization plane of light passing through the magneto-optic film. The method is applicable for measuring the stray field distribution of flat nanomagnetic materials, structures and devices. - The method can especially be used to perform fast quantitative measurements of stray field distributions at the surface of an object. - The magneto-optic indicator film technique (MOIF) is a fast, non-destructive method, making it an attractive option for materials analysis and testing in the industry. - MOIF measurements can be done without any sample preparation and do not rely on specific surface properties of the object. It can be applied to the characterization of rough samples as well as of samples with non-magnetic cover layers. - MOIF can quantitatively measure magnetic field distributions: • with a one-shot measurement which typically takes a few seconds • over areas of several square centimetres (over diameters of up to 15 cm with special techniques) • in a field range from 1 mT to more than 100 mT • with down to 1 µm spatial resolution - Although techniques with nano-scale resolution are suitable for analysing the details of magnetic field structure, their ability to characterize larger areas is limited by their scanning area. Therefore, the MOIF technique is an indispensable complementary method that can offer a more comprehensive understanding of material properties. This document focuses on the calibration procedures, calibrated measurement process, and evaluation of measurement uncertainty to ensure the traceability of quantitative magnetic field measurements obtained through the magneto-optic indicator film technique.