光伏组件.潜在诱发退化检测的试验方法.第1-1部分:晶体硅.分层

[中文适用范围]： IEC TS 62804-1-1 第 1-1 部分定义了针对结晶硅光伏组件层压件中电势诱导退化 - 分层（PID-d）模式的测试和评估程序，主要针对具有一面或两面玻璃的组件。该文件评估的是由地面与组件电池电路之间的电流转移引起的分层。驱动此测试旨在触发的分层元素包括：湿热暴露相关的附着力降低、界面处的钠积累以及电池电路、金属化层和组件内其他部件在电压电位激活下的阴极气体析出。与所施加应力因素相关的结晶硅光伏组件功率变化的内容（即 IEC TS 62804-1 的管辖范围）不在此范围内。 [外文原描述]： IEC 62804-1-1:2020 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules-principally those with one or two glass faces. This document evaluates delamination attributable to current transfer between ground and the module cell circuit. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope.