标准摘要
[中文适用范围]： IEC TS 62876-4-1:2025 是一项技术规范，它建立了一个通用可靠性测试程序，以验证量子点纳米材料和量子点光转换膜 (Q-LCF) 性能的可靠性。Q-LCF 与其他组件一起用作制造纳米光电显示设备的组件，目前主要是液晶显示器 (LCD)。该测试程序定义了 Q-LCF 产品的标准化老化条件、方法和数据评估。这些测试的结果定义了标准化老化条件下的稳定性，以定量评估 Q-LCF 的可靠性。本文件中指定的程序是为 Q-LCF 设计的，但可以扩展为其他类型的光转换膜或相关组件的指南。 [外文原描述]： IEC TS 62876-4-1:2025, which is a Technical Specification, establishes a general reliability testing programme to verify the reliability of the performance of quantum dots nanomaterials, and quantum dot enabled light conversion films (Q-LCFs). The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display devices, mainly liquid crystal display (LCD) currently, with other components. This testing programme defines standardized aging conditions, methodologies and data assessment for Q-LCF product. The results of these tests define a stability under standardized aging conditions for quantitative evaluation of the reliability of the Q-LCF. The procedures specified in this document were designed for Q-LCF but can be extended to serve as a guideline for other kinds of light conversion films or related subassemblies as well.
英文名称Nanomanufacturing – Reliability assessment – Part 4-1: Nanophotonic products – Optical stability test of quantum dot enabled light conversion films: Temperature, humidity and light exposure