光伏电池用材料 - 第 1 部分：晶体硅片的电学特性规范

[中文适用范围]： IEC TS 63371-1:2026适用于用作太阳能电池衬底的晶体硅片，描述了测量此类硅片电学特性的方法，但不涉及硅片的机械信息。附录A列出了广泛接受的电学特性参考值。本文件旨在为晶体硅片建立标准化规范，明确其电学特性、适用的测试方法以及这些特性的可接受范围。 [外文原描述]： IEC TS 63371-1:2026 applies to crystalline silicon wafers for use as the substrates in making photovoltaic cells. It describes the methods for measuring the electrical characteristics of these silicon wafers. It does not provide mechanical information about these wafers. Annex A shows the widely accepted electrical characteristics values. The purpose of this document is to establish a standardized specification for crystalline silicon wafers, defining their electrical characteristics, the applicable test methods, and the acceptable value ranges for those characteristics.