标准摘要
[中文适用范围]： 本标准规定了测定钴金属粉末中20 IJg/g～300 IJg/g范围内硅的质量分数的光度法。 [外文原描述]： ISO 11877:2008 specifies a photometric method to be used for the determination of the mass fraction of silicon in the range of 20 µg/g to 300 µg/g in cobalt metal powders.
英文名称Hardmetals — Determination of silicon in cobalt metal powders — Photometric method