标准摘要
[中文适用范围]： 本文件规定了测量像场相对辐照度的通用光学测试方法。 本文件适用于 λ = 100 nm 至 λ = 1 μm 光谱范围内的光学成像系统。 理论反射以及与计算的比较仅适用于光学系统。 本文件适用于旋转不变和旋转变化系统；例如，变形系统也包括在内。 还包括伸缩系统。 本文件的标题指的是像场中的相对辐照度，但本文件也适用于相对辐射功率的测定。 注：对于伸缩系统，仅说明辐射功率是合适的；对于大多数成像系统，从辐射功率到辐照度的转换很容易。 就测量而言，本文件也适用于电光系统。 所描述的两种方法的不同之处在于遮蔽眩光的影响。 [外文原描述]： This document specifies general optical test methods for the measurement of the relative irradiance in the image field. This document is applicable to optical imaging systems in the optical spectral region from λ = 100 nm to λ = 1 μm. Theoretical reflections and the comparison with the calculation apply only to optical systems. This document is applicable to rotationally invariant and rotationally variant systems; anamorphic systems, for example, are included. Telescopic systems are also included. The title of this document refers to the relative irradiance in the image field, but this document is also applicable to determination of the relative radiant power. NOTE For telescopic systems, it is suitable to state only the radiant power; for most imaging systems, the conversion from radiant power to irradiance is easy. As far as measurements are concerned, this document is also applicable to electro-optical systems. The two methods described differ particularly in the influence of veiling glare.
英文名称Optics and photonics — General optical test methods — Measurement of relative irradiance in the image field