光学和光子学.光学元件总散射的试验方法

[中文适用范围]： 本文件规定了测定镀膜和未镀膜光学表面总散射的程序。 给出了测量前向散射或后向散射对光学元件总散射的贡献的程序。 本文件适用于光学表面曲率半径大于 10 m 的镀膜和未镀膜光学元件。 本文件涵盖的测量波长范围从 250 nm 以上的紫外线到 15 µm 以下的红外光谱区域。 对于 190 nm 至 250 nm 之间的深紫外测量，考虑并描述了特定方法。 一般来说，对于 15 µm 以上的波长，光学散射被认为可以忽略不计。 [外文原描述]： This document specifies procedures for the determination of the total scattering by coated and uncoated optical surfaces. Procedures are given for measuring the contributions of the forward scattering or backward scattering to the total scattering of an optical component. This document applies to coated and uncoated optical components with optical surfaces that have a radius of curvature of more than 10 m. Measurement wavelengths covered by this document range from the ultraviolet above 250 nm to the infrared spectral region below 15 µm. For measurements in the deep ultraviolet between 190 nm to 250 nm, specific methods are considered and are described. Generally, optical scattering is considered as neglectable for wavelengths above 15 µm.