光学和光子学 — 光学元件和光学系统的测量 — 第4部分：ISO 10110中规定的表面形状和波前变形公差的解释和评估

[中文适用范围]： 本文件适用于解释与测量光学元件表面形状偏差或光学系统波前变形相关的数据。通常，测量数据是通过干涉测量技术生成的，但其他测量技术也能生成描述表面形状偏差或波前变形的测量数据。本文件给出了根据ISO 10110-5和/或ISO 10110-14在光学元件和系统图纸准备中规定的光学功能和值的定义，其对应的术语、功能和值列于ISO 10110-5:2026的附录B中。 [外文原描述]： This document applies to the interpretation of data relating to the measurement of the surface form deviations of optical elements or the wavefront deformations of optical systems. Often the measurement data are generated by using interferometric techniques, but other measurement techniques also generate measurement data to describe the surface form deviations or wavefront deformations. This document gives definitions of the optical functions and values specified in the preparation of drawings for optical elements and systems, made in accordance with ISO 10110-5 and/or ISO 10110-14 for which the corresponding nomenclature, functions, and values are listed in ISO 10110-5:2026, Annex B.