标准摘要
[中文适用范围]： 本国际标准定义了 AEM 实践中使用的术语。 它涵盖了一般概念和特定概念，并根据其层次结构以系统顺序进行分类。 本国际标准适用于与AEM实践相关的所有标准化文件。 此外，本国际标准的某些部分适用于那些与相关领域（例如TEM、STEM、SEM、EPMA、EDX）实践相关的文件，以定义这些领域通用的术语。 [外文原描述]： ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.
英文名称Microbeam analysis — Analytical electron microscopy — Vocabulary