标准摘要
[中文适用范围]： 本国际标准规定了分析人员在使用 X 射线光电子能谱 (XPS) 分析测试样本后报告的最低信息水平。 它包括要记录在分析记录上或分析记录中的信息。 [外文原描述]： ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
英文名称Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)