标准摘要
[中文适用范围]： 本部分 ISO 16526 规定了在高压发生器次级侧对恒定电位（直流）X 射线系统的平均高电压进行直接和绝对测量的方法。其目的是检查 X 射线系统控制单元上指示的高电压值是否对应。该方法用于确保 X 射线系统的可重复运行，因为电压特别影响材料的穿透力、X 射线图像的对比度以及辐射防护要求。 [外文原描述]： ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system. This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
英文名称Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 1: Voltage divider method