标准摘要
[中文适用范围]： 本国际标准通过分析使用波长色散 X 射线光谱仪在仪器上获得的 X 射线光谱，为元素识别和样品中特定体积（微米级）内特定元素的存在情况的研究提供了指导。 电子探针微量分析仪或扫描电子显微镜。 [外文原描述]： ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm 3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
英文名称Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry