标准摘要
[中文适用范围]： 本文件规定了一种方法，用于确定单离子计数飞行时间 (TOF) 二次离子质谱仪中强度标度线性度可接受的发散极限的最大计数率，该方法使用基于多聚体光谱中同位素比率的测试。 （四氟乙烯）（PTFE）。 它还包括一种校正因微通道板 (MCP) 或闪烁体和光电倍增器后跟时间数字转换器 (TDC) 检测系统因二次离子到达其死亡期间造成的强度损失而引起的强度非线性的方法。 -时间。 校正可以将 95% 线性度的强度范围增加多达 50 倍以上，以便对于那些已证明相关校正公式有效的光谱仪可以采用更高的最大计数率。 [外文原描述]： This document specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid.
英文名称Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers