环境固体基质 用X射线荧光光谱法测定元素组成

[中文适用范围]： 本文件规定了使用能量色散X射线荧光（EDXRF）光谱法或波长色散X射线荧光（WDXRF）光谱法，通过使用与样品基质相匹配的标准物质进行校准，对均质固体废弃物、土壤、类土壤材料和污泥中主要和微量元素浓度进行定量测定的程序。本文件适用于以下元素：Na、Mg、Al、Si、P、S、Cl、K、Ca、Ti、V、Cr、Mn、Fe、Co、Ni、Cu、Zn、As、Se、Br、Rb、Sr、Y、Zr、Nb、Mo、Ag、Cd、Sn、Sb、Te、I、Cs、Ba、Ta、W、Hg、Tl、Pb、Bi、Th 和 U。根据所使用的元素和仪器，可测定的质量分数范围约为0.0001%至100%。附录A中增加了一种用于固体和液体材料（如废弃物、污泥和土壤）的可选XRF筛查方法，该方法在半定量水平上提供总的元素特征分析，其校准基于制造商预先设定的与基质无关的校准曲线。 [外文原描述]： This document specifies the procedure for a quantitative determination of major and trace element concentrations in homogeneous solid waste, soil, soil-like material and sludge by energy dispersive X-ray fluorescence (EDXRF) spectrometry or wavelength dispersive X-ray fluorescence (WDXRF) spectrometry using a calibration with matrix-matched standards. This document is applicable for the following elements: Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, Ta, W, Hg, Tl, Pb, Bi, Th and U. Concentration levels between a mass fraction of approximately 0,000 1 % and 100 % can be determined depending on the element and the instrument used. An optional XRF screening method for solid and liquid material as waste, sludge and soil is added in Annex A which provides a total element characterization at a semi-quantitative level, where the calibration is based on matrix-independent calibration curves, previously set up by the manufacturer.