标准摘要
[中文适用范围]： 本文件给出了用电镜法确定纳米晶须晶体表观生长方向的方法。该方法适用于各种由不同方法合成的晶须状晶体材料。 也可用于指导确定钢、合金或其他材料中第二相粒子的一个轴的方向。 被测晶体试样的适用直径或宽度范围为数十到数百纳米，具体取决于透射电镜(TEM)加速电压和材料本身。 [外文原描述]： This document gives a method for determination of the apparent growth direction of nanocrystals by transmission electron microscopy. This method is applicable to all kinds of wire-like crystalline materials synthetized by various methods. This document can also guide in determining an axis direction of the second-phase particles in steels, alloys, or other materials. The applicable diameter or width of the crystals to be tested is in the range of tens to one hundred nanometres, depending on the accelerating voltage of the transmission electron microscope (TEM) and the material itself. Position, which is curved, twisted, and folded, to determine the apparent growth direction, should not be used.
英文名称Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy