标准摘要
[中文适用范围]： 本文件规定了与分析结果一起报告的最小光谱信息量，以描述 X 射线光电子绝缘样品的芯级结合能测量中的电荷控制和电荷校正方法。 它还提供了结合能测量中的电荷控制和电荷校正的方法。 [外文原描述]： This document specifies the minimum amount of information spectroscopy to be reported with the analytical results to describe the methods of charge control and charge correction in measurements of core-level binding energies for insulating specimens by X‑ray photoelectron. It also provides methods for charge control and for charge correction in the measurement of binding energies.
英文名称Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction