精细陶瓷（先进陶瓷 先进技术陶瓷） - 使用FTIR光谱仪使用黑体参考的正常光谱发射率测量方法

[中文适用范围]： 本文件规定了使用黑体辐射源与傅里叶变换红外光谱仪（FTIR）在高温条件下测定精细陶瓷的法向比色发射率和法向准总比色发射率的方法。本文件适用于在波长 \(1,67 \mu \mathrm{m}\) 到 \(25 \mu \mathrm{m}\) 之间不透明且高度非反射的精细陶瓷、陶瓷基复合材料以及连续纤维增强陶瓷基复合材料。适用温度范围约为 \(350 \mathrm{~K}\) 到 \(1100 \mathrm{~K}\)。 [外文原描述]： This document specifies a method used for the determination of normal spectral emissivity and normal quasi-total emissivity of fine ceramics using blackbody reference with a Fourier transform infrared spectrometer (FTIR) at elevated temperatures. This method is applicable to fine ceramics, ceramic matrix composites, and continuous fibre-reinforced ceramic matrix composites which are opaque and highly non-reflective at wavelengths between 1,67 μm and 25 μm. The applicable temperature range is approximately 350 K to 1 100 K.