标准摘要
[中文适用范围]： 本国际标准旨在定义在X射线光电子能谱（XPS）中峰拟合和峰拟合结果应如何报告。适用于单个光谱或一组相关光谱的拟合，例如在深度剖面测量期间获得的光谱。本国际标准提供了那些应在报告中说明的参数列表，无论是否需要可重复的峰拟合，或者需要拟合多个光谱并将拟合光谱进行比较。本国际标准不提供峰拟合的指导或应采用的过程。 [外文原描述]： ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.
英文名称Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy