微束分析 - 分析透射电子显微镜 - 分层材料横截面图像中界面位置的测定方法

[中文适用范围]： 本文件规定了多层材料横截面图像中标记的不同层之间的平均界面位置的测定程序。 本文件不适用于通过多层切片模拟（MSS）方法预期的多层材料的仿真界面的测定。 本文件适用于使用透射电子显微镜（TEM）或扫描透射电子显微镜（STEM）记录的多层材料横截面图像，以及使用能量色散X射线光谱仪（EDS）或电子能量损失光谱仪（EELS）记录的元素映射图像。 本文件还适用于使用内置在数字相机、计算机中的图像传感器或成像板上记录的数字化图像，其中数字化图像是通过使用图像扫描仪将记录在感光胶片上的模拟图像转换而获得的。 [外文原描述]： This document specifies a procedure for the determination of the averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered material. This document does not apply for determining the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of multi-layered materials recorded using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and cross-sectional elemental mapping images using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to digitized images recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate, where the digitalized image is obtained by converting an analogue image recorded on photographic film using an image scanner.