标准摘要
[中文适用范围]： 本文件描述了使用原子力显微镜 (AFM) 测定顺应性材料的弹性模量的程序。 测量柔顺材料表面上的力-距离曲线，并使用基于 Johnson-Kendall-Roberts (JKR) 理论的两点法进行分析。 本文件适用于弹性模量范围为 100 kPa 至 1 GPa 的合规材料。 空间分辨率取决于 AFM 探针与表面之间的接触半径，通常约为 10-20 nm。 [外文原描述]： This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
英文名称Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method