纳米技术 - 通过透射电子显微镜测定粒度分布的方案

[中文适用范围]： 本文件详细说明了如何捕获、测量和分析透射电子显微镜图像以获得纳米级的颗粒尺寸和形状分布。 本文件广泛适用于纳米物体以及尺寸大于 100 nm 的颗粒。 该方法的确切工作范围取决于所需的不确定性和透射电子显微镜的性能。 这些要素可以根据本文件中描述的要求进行评估。 [外文原描述]： This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale. This document broadly is applicable to nano-objects as well as to particles with sizes larger than 100 nm. The exact working range of the method depends on the required uncertainty and on the performance of the transmission electron microscope. These elements can be evaluated according to the requirements described in this document.