标准摘要
[中文适用范围]： 提供本文件是为了帮助对材料上的薄膜进行表面分析，这些材料不被认为含有碳化合物作为预期成分，但在调查光谱中观察到 C1s 峰。 这些薄膜可以是通过有氧或电化学氧化在金属和合金上生成的薄膜，也可以是沉积在惰性基材上的薄膜。 所描述的过程不适用于颗粒在基底上的不连续沉积。 除了这个例外，还提供了一个简单的程序来识别来自含碳表面污染物的 C1s 信号。 当 C1s 峰被识别为由偶然的覆盖层产生时，可以校正从测量光谱得出的成分的影响。 推荐的程序以“如果-那么”格式构造的简单规则的形式提供，其目的是它们所包含的信息可以被数据系统中的自动化程序所利用。 所提供的规则仅利用从 XPS 调查扫描中检索到的信息。 [外文原描述]： This document is provided to assist in the surface analysis of thin films on materials which are not thought to contain carbon compounds as intended components but for which a C1s peak is observed in the survey spectrum. The films can be those generated on metals and alloys by aerobic or electrochemical oxidation or be those deposited on inert substrates. The procedure described is not suitable for discontinuous deposits of particles on a substrate. With this exception, a simple procedure is provided for identifying the C1s signal from carbon-containing surface contamination. When the C1s peak is identified as arising from an adventitious over-layer the composition derived from the survey spectrum can be corrected for its influence. Recommended procedures are provided in the form of simple Rules structured in the 'If - Then` format with the intention that the information they embody might be utilised by automated procedures in data-systems. The rules provided utilize only information retrieved from the XPS survey scan.
英文名称Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containing compounds