标准摘要
[中文适用范围]： 本文档描述了原子力显微镜 (AFM) 探针探针尖端的定量表征以及通过有限探针尺寸扩张的 AFM 形貌图像的恢复过程。 使用合适的参考材料通过图像重建提取探针顶点的三维形状。 本文件适用于固体材料表面AFM形貌图像的重建。 [外文原描述]： This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
英文名称Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size