标准摘要
[中文适用范围]： 本国际标准规定了一种用于一般分析目的的静态二次离子质谱仪的正离子相对强度标度的重复性和恒定性确认方法。该方法仅适用于配备电子枪进行电荷中和的仪器。本方法不旨在作为强度/质量响应函数的校准。该校准可由仪器制造商或其他组织进行。本方法提供数据以确认仪器使用过程中的相对强度恒定性。文中就某些可能影响该恒定性的仪器设置给出了指导。 [外文原描述]： ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.
英文名称Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry