标准摘要
[中文适用范围]： 本国际标准定义了电子探针显微分析（EPMA）实践中使用的术语。它涵盖了根据系统层次分类的一般和特定概念。本国际标准适用于与EPMA实践相关的所有标准化文件。此外，本国际标准的某些部分适用于与相关领域（SEM、AEM、EDX等）实践相关的文件，以定义这些领域共有的术语。 [外文原描述]： ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
英文名称Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary