标准摘要
[中文适用范围]： 本文件提供了如何使用电子背散射衍射 (EBSD) 生成可靠且可重复的晶体取向测量的指南。它解决了样品制备、仪器配置、仪器校准和数据采集的要求。 [外文原描述]： This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
英文名称Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction