产品几何技术规范（GPS）.表面结构:面积.第73部分:材料测量表面缺陷的术语和定义

[中文适用范围]： 本文件定义了符合 ISO 5436-1 和 ISO 25178-70 的材料测量和校准样本表面上可能存在的几何缺陷类别，并定义了应对这些缺陷的方法的术语。 本文件适用于以下情况： a) 帮助表面计量材料测量的客户和用户在从制造商和供应商处获取材料测量时指定其标称特征（理想几何特性）； b) 使材料测量的使用者能够制定自己的规则和政策来应对缺陷的发生，以尽量减少其测量的不确定性；注：例如，ISO/IEC 17025:2017、7.2.1.1、7.2.1.3、7.3.1 和 7.8.5 c) 和 d) 中要求此类策略。 c) 使校准实验室及其客户能够就如何处理已送去校准的材料测量的缺陷达成共同政策； d) 教育物质测量的使用者了解不同类型缺陷的不同意义和重要性； e) 其他涉及测量位置选择、测量区域或测量回避区域选择问题的 GPS 标准。 [外文原描述]： This document defines classes of geometrical defects that might be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70, and defines terms for ways of responding to these defects. This document is applicable as follows: a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when obtaining them from manufacturers and suppliers; b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimize the uncertainty of their own measurements; NOTE Such policies are required in ISO/IEC 17025:2017, 7.2.1.1, 7.2.1.3, 7.3.1 and 7.8.5 c) and d), for example. c) to enable calibration laboratories and their customers to agree on a common policy on how to treat defects on a material measure that has been sent for calibration; d) to educate users of material measures about the different significance and importance of different kinds of defect; e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or avoided in measurement.