标准摘要
[中文适用范围]： 本国际标准规定了描述通过电子刺激俄歇电子能谱测量绝缘样品的俄歇电子跃迁的电荷控制方法所需的最小信息量，并与分析结果一起报告。 附录 A 中提供了有关在 AES 分析之前或期间发现对电荷控制有用的方法的信息。 本附件还包含一个总结方法或途径的表格，按方法的简单性排序。 有些方法适用于大多数仪器，其他方法需要特殊硬件，其他方法可能需要重新安装样本或更换样本。 类似的 X 射线光电子能谱国际标准也已发布。 [外文原描述]： ISO 29081:2010 specifies the minimum amount of information required for describing the methods of charge control in measurements of Auger electron transitions from insulating specimens by electron-stimulated Auger electron spectroscopy and to be reported with the analytical results. Information is provided in Annex A on methods that have been found useful for charge control prior to or during AES analysis. This annex also contains a table summarizing the methods or approaches, ordered by simplicity of approach. Some methods will be applicable to most instruments, others require special hardware, others might involve remounting the specimen or changing it. A similar International Standard has been published for X‑ray photoelectron spectroscopy (ISO 19318).
英文名称Surface chemical analysis — Auger electron spectroscopy — Reporting of methods used for charge control and charge correction