搪瓷和搪瓷.检测和定位缺陷的低压试验.第1部分:非异型表面的拭子试验

[中文适用范围]： 本文件规定了两种低电压测试，用于检测和定位搪瓷涂层中延伸至基体金属的缺陷。 方法A（电气）适用于快速检测并确定缺陷的大致位置。 方法B（光学）基于颜色效果，适用于更精确地检测缺陷及其确切位置。 这两种方法通常应用于平坦表面。 对于更复杂的形状，例如起伏和/或波纹表面，ISO 8289-2 适用。 注 1：选择正确的测试方法对于区分方法 B 检测到的电导率增加的区域与延伸到基体金属的实际孔隙至关重要，这两种方法都可以检测到。 注2：低电压试验是一种非破坏性检测缺陷的方法，因此与ISO 2746中规定的高电压试验完全不同。 高电压和低电压试验的结果不具有可比性并且会有所不同。 [外文原描述]： This document specifies two low voltage tests for detecting and locating defects that extend to the basis metal in vitreous and porcelain enamel coatings. Method A (electrical) is applicable to the rapid detection and determination of the general location of defects. Method B (optical), based on colour effects, is applicable to the more precise detection of defects and their exact locations. Both methods are commonly applied to flat surfaces. For more intricate shapes, such as undulated and/or corrugated surfaces, ISO 8289-2 is applicable. NOTE 1 Selection of the correct test method is critical to distinguish the areas of increased conductivity detected by method B from actual pores that extend to the basis metal, which can be detected by both methods. NOTE 2 The low voltage test is a non-destructive method of detecting defects and, therefore, is completely different from the high voltage test specified in ISO 2746. The results of the high and low voltage tests are not comparable and will differ.