搪瓷和搪瓷.检测和定位缺陷的低压试验.第2部分:异型表面的泥浆试验

[中文适用范围]： 本文件规定了一种低电压测试方法，用于检测和定位波纹和/或波状轮廓的搪瓷涂层中出现的缺陷（孔隙、裂纹或弹出），并向下延伸到金属基底。 该方法基于颜色效应（光学方法），适用于缺陷及其准确位置的精确检测。 它可用于非平坦的、更具异形的形状，例如波纹或起伏的表面。 注：低压测试是一种无损测试，用于检测延伸至金属基底的缺陷，因此与 ISO 2746 中的高压测试完全不同。 [外文原描述]： This document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base. The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces. NOTE The low-voltage test is a non-destructive test for detecting defects extending down to the metal base and is, therefore, completely different in comparison to the high-voltage test in accordance with ISO 2746.