识别卡.试验方法.第3部分:附带触点与相关接口设备的集成电路卡

[中文适用范围]： ISO/IEC 10373的本部分根据ISO/IEC 7816中给出的定义，定义了具有触点的集成电路卡和相关接口器件的特性的测试方法。 每种测试方法都交叉引用了一个或多个基础标准，这些标准可以是ISO/IEC 7810 或一项或多项补充国际标准，定义了身份证应用中采用的信息存储技术。 注：可接受性标准不构成 ISO/IEC 10373 本部分的一部分，但可在上述国际标准中找到。 ISO/IEC 10373 的这一部分定义了特定于带触点的集成电路技术的测试方法。 ISO/IEC 10373-1 定义了一种或多种卡技术通用的测试方法，其他部分定义了其他特定技术的测试。 ISO/IEC 10373 本部分中定义的测试方法旨在单独且独立地执行。 给定的卡不需要按顺序通过所有测试。 ISO/IEC 10373 本部分定义的测试方法基于 ISO/IEC 7816-3。 使用 ISO/IEC 10373 本部分中定义的测试方法确定的卡和 IFD 的一致性并不排除现场出现故障。 可靠性测试不属于 ISO/IEC 10373 本部分的范围。 ISO/IEC 10373 本部分未定义任何测试来确定集成电路卡的完整功能。 测试方法仅要求验证最低限度的功能。 最小功能定义如下。 - 卡中存在的任何集成电路继续显示符合基本标准的复位响应应答。 - 与卡中存在的任何集成电路相关的任何触点继续显示符合基本标准的电阻。 [外文原描述]： ISO/IEC 10373-3:2010 defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary International Standards that define the information storage technologies employed in identification card applications. ISO/IEC 10373-3:2010 defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts define other technology‑specific tests. Test methods defined in ISO/IEC 10373-3:2010 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in ISO/IEC 10373-3:2010 are based on ISO/IEC 7816-3. Conformance of cards and IFDs determined using the test methods defined in ISO/IEC 10373-3:2010 does not preclude failures in the field. Reliability testing is outside the scope of ISO/IEC 10373-3:2010. ISO/IEC 10373-3:2010 does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. Minimum functionality is defined as follows. Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard. Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.