信息技术 - 用于信息交换和存储的数字记录媒体 - 用于长期数据存储的光盘寿命估计的测试方法

[中文适用范围]： 本文件规定了一种用于估计记录在可刻录或可重写光学盘上存储的信息可恢复性的加速老化测试方法。该方法基于对数正态分布的理论假设。详细说明了以下格式的测试： DVD-R/RW/RAM光盘、+R/+RW光盘、CD-R/RW光盘和BD可记录/可重写光盘。 该测试可以应用于其他光学盘格式，通过替换适当的规格，并且可以在将来根据需要更新委员会。 本文件包括： — 应力条件： — 基础和严格的应力条件用于测试和后续分析，使用Erying方法和Arrhenius方法； — 存储环境条件，在其中估计存储在光盘上的数据的寿命： — 受控存储条件，温度=25°C且湿度=50%，代表全年空调。 使用Erying方法估计在此存储条件下的寿命； — 严酷的存储条件，温度=30°C和湿度=80%，代表用户处理和存储光盘的最极端条件。 使用Arrhenius方法估计在此存储条件下的寿命； — 对评估系统的描述； — 样品制备和数据获取程序； — 测试特定磁盘类型中使用的定义和方法； — 分析测试结果以确定存储数据的寿命； — 报告估计的存储数据寿命格式。 该方法学仅考虑温度和相对湿度的影响。它不尝试建模由于复杂故障机制动力学导致的降解，也不测试对光线、腐蚀性气体、污染物、处理或播放子系统的变异性暴露。 接触这些额外压力源或更高水平的温度和相对湿度的盘预计会经历更短的使用寿命。 [外文原描述]： ISO/IEC 16963:2017 specifies an accelerated ageing test method for estimating the lifetime of the retrievability of information stored on recordable or rewritable optical disks. The method is based on the theoretical assumption that the lifetime of data recorded on an optical disk has a lognormal distribution. Detailed testing is specified for the following formats: DVD-R/RW/RAM disks, +R/+RW disks, CD-R/RW disks and BD recordable/rewritable disks. The testing can be applied to additional optical-disk formats with substitution of the appropriate specifications and can also be updated by the committee in the future as required. ISO/IEC 16963:2017 includes: - stress conditions: - Basic and Rigorous stress-conditions for testing and subsequent analysis using both the Eyring and Arrhenius methods; - ambient storage conditions in which the lifetime of data stored on optical disk is estimated: - a Controlled storage-condition, Temp = 25 °C and RH = 50 %, representing full-time air conditioning. The Eyring method is used to estimate the lifetime under this storage condition; - a Harsh storage-condition, Temp = 30 °C and RH = 80 %, representing the most severe conditions in which users handle and store optical disks. The Arrhenius method is used to estimate the lifetime under this storage condition; - a description of the evaluation system; - procedures for specimen preparation and data acquisition; - definitions and methods used in testing specific disk types; - analysis of test results to determine the lifetime of stored data; - a format for reporting the estimated lifetime of stored data. The methodology includes only the effects of temperature and relative humidity. It does not attempt to model degradation due to complex failure mechanism kinetics, nor does it test for exposure to light, corrosive gases, contaminants, handling, or variations in playback subsystems. Disks exposed to these additional sources of stress or higher levels of temperature and relative humidity are expected to experience shorter usable lifetime.