标准摘要
[中文适用范围]： 包括但不限于相关行业的质量控制、产品认证及安全评估等环节。 ***此介绍可能不准确，请注意参考原文。 [外文原描述]： This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data. The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity.If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.Cross Reference:
英文名称Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods