标准摘要
This document describes the requirements of the following test methods for counterfeit detection of electronic components:aMethod A: General EVI, Sample Selection, and HandlingbMethod B: Detailed EVI, including Part Weight measurementcMethod C: Testing for RemarkingdMethod D: Testing for ResurfacingeMethod E: Part Dimensions measurementfMethod F: Surface Texture Analysis using SEMThe scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.Cross Reference:
英文名称Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods